M. Jakůbek, J. Jakůbek, J. Žemlička, M. Kroupa, F. Krejčí: Probe and scanning system for 3D response mapping of pixelated semiconductor detector with X-rays and the timepix device. In: AIP Conference Proceedings. AIP, 2012, pp. 461-466. doi:10.1063/1.3688846