M. Jakůbek, J. Jakůbek, J. Žemlička, M. Platkevič, V. Havranek, V. Semian: 3D imaging of radiation damage in silicon sensor and spatial mapping of charge collection efficiency. Journal of Instrumentation 8(03), C03023-C03023 (2013). doi:10.1088/1748-0221/8/03/C03023