T. Billoud, C. Leroy, C. Papadatos, M. Pichotka, S. Pospíšil: Homogeneity study of a GaAs:Cr pixelated sensor by means of X-rays. Journal of Instrumentation 13(04), P04002-P04002 (2018). doi:10.1088/1748-0221/13/04/P04002