CsPbBr3 crystallographic plane defect metrology
- NázevTitle
- CsPbBr3 crystallographic plane defect metrologyCsPbBr3 crystallographic plane defect metrology
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- A. Owens, N. Grundmanis, J. Žemlička, A. Lupilov, T. Slavíček
- DOIDOI
- 10.1016/j.nima.2026.172101
- Časopis / citaceJournal / citation
- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 1093, 172101 (2027) · ISSN 0168-9002
- RokYear
- 2027
- JazykLanguage
- eng
- ZáznamyRecords
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
In this paper we investigate crystallographic plane defects in a CsPbBr3 crystal grown by the Bridgman method. A number of planar gamma-ray detectors were fabricated from this crystal and the effects of plane defects on the X-ray response evaluated using spatially resolved X-ray spectroscopy in the 6 to 30 keV energy range. We show that by the judicious placement of the electrodes, the effect on spectrometric performance can be largely mitigated, depending of the severity of the defect(s). For example, when the electrodes are placed parallel to the plane defect, the photo-peak at 59.54 keV from a full area exposure to an Am241 radioactive source is not resolved, and there was little correlation between the optical image and the X-ray images in the 6 to 30 keV band. Placing the electrodes perpendicular to the plane of the defect, the full energy peak is clearly resolved and has a FWHM of 4.3 keV at 59.54 keV, comparable to a planar detector without defects. In this case, there is a good correlation between the optical image of the defects and the 6-30 keV X-ray images.
In this paper we investigate crystallographic plane defects in a CsPbBr3 crystal grown by the Bridgman method. A number of planar gamma-ray detectors were fabricated from this crystal and the effects of plane defects on the X-ray response evaluated using spatially resolved X-ray spectroscopy in the 6 to 30 keV energy range. We show that by the judicious placement of the electrodes, the effect on spectrometric performance can be largely mitigated, depending of the severity of the defect(s). For example, when the electrodes are placed parallel to the plane defect, the photo-peak at 59.54 keV from a full area exposure to an Am241 radioactive source is not resolved, and there was little correlation between the optical image and the X-ray images in the 6 to 30 keV band. Placing the electrodes perpendicular to the plane of the defect, the full energy peak is clearly resolved and has a FWHM of 4.3 keV at 59.54 keV, comparable to a planar detector without defects. In this case, there is a good correlation between the optical image of the defects and the 6-30 keV X-ray images.