Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors
- NázevTitle
- Slow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectorsSlow-neutron-induced charged-particle emission-channeling-measurements with Medipix detectors
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- U. Koester, C. Granja, J. Jakůbek, J. Uher, J. Vacik
- DOIDOI
- 10.1016/j.nima.2010.06.184
- Časopis / citaceJournal / citation
- Nuclear Instruments and Methods in Physics Research, Section A, Accelerators, Spectrometers, Detectors and Associated Equipment. 2011, 2011(633), S267-S269. ISSN 0168-9002.
- RokYear
- 2011
- JazykLanguage
- eng
- WoSWoS
- 000292782400078
- ScopusScopus
- 2-s2.0-79959847256
- RIVRIV
- RIV/68407700:21670/11:00165659!RIV12-MSM-21670___
- ProjektProject
- Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation
AbstraktAbstract
The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measurement and allow reviving this technique for practical applications. We report on the use of the TimePix detector for such emission channeling experiments with samples containing 6Li, 7Be or 10B.
The lattice location of helium, lithium, beryllium, boron or sodium host or impurity atoms in single crystals can be studied by slow-neutron-induced charged particle emission channeling measurements. Modern silicon pixel detectors can cover an entire emission channeling pattern in a single measurement and allow reviving this technique for practical applications. We report on the use of the TimePix detector for such emission channeling experiments with samples containing 6Li, 7Be or 10B.