Ústav technické a experimentální fyziky Institute of Experimental and Applied Physics

Study of technological and radiation defects in silicon

NázevTitle
Study of technological and radiation defects in siliconStudy of technological and radiation defects in silicon
Druh výsledkuResult type
Příspěvek ve sborníkuProceedings paper
AutořiAuthors
S. Semenko, V. Sopko, B. Sopko, O. Semenko
Časopis / citaceJournal / citation
In: Silicon 2010. Rožnov pod Radhoštěm: TECON-Scientific, 2010. pp. 279-284. Prvni. ISBN 978-80-254-7361-0.
JazykLanguage
eng
RIVRIV
RIV/68407700:21220/10:00177086!RIV11-MSM-21220___
ProjektProject
Fundamentální experimenty ve fyzice mikrosvětaFundamental Experiments in Physics of Microworld

AbstraktAbstract

In this work we have examined the process of defect annealing of neutron transmutation phosphorus-doped n-type silicone (NTD) detector irradiated by neutrons. Radiation defects produced during irradiation of float zone silicon were characterized by means of DLTS. Band gap position, capture cross section of detected levels appearing during irradiation have been measured in order to identify the radiation centers. Obtained experimental results will be further utilized for optimization of the techniques and methods used in the production of silicon power devices, i.e. to the development of studies and experiments aimed on increasing the radiation hardness of silicon detectors used in nuclear accelerators.

In this work we have examined the process of defect annealing of neutron transmutation phosphorus-doped n-type silicone (NTD) detector irradiated by neutrons. Radiation defects produced during irradiation of float zone silicon were characterized by means of DLTS. Band gap position, capture cross section of detected levels appearing during irradiation have been measured in order to identify the radiation centers. Obtained experimental results will be further utilized for optimization of the techniques and methods used in the production of silicon power devices, i.e. to the development of studies and experiments aimed on increasing the radiation hardness of silicon detectors used in nuclear accelerators.