Non-contact electron optics system for coincidence imaging analysis
- NázevTitle
- Non-contact electron optics system for coincidence imaging analysisNon-contact electron optics system for coincidence imaging analysis
- Druh výsledkuResult type
- Příspěvek ve sborníkuProceedings paper
- AutořiAuthors
- M. Kroupa, J. Jakůbek, F. Krejčí
- DOIDOI
- 10.1142/9789814307529_0104
- Časopis / citaceJournal / citation
- In: "Astroparticle, Particle and Space Physics, Detectors and Medical Physics Applications", Proceedings of the 11th Conference, Villa Olmo, Como, Italy, 5-9 October 2009. Singapore: World Scientific Publishing, Ltd., 2010. pp. 631-635. Astroparticle, Particle, Space Physics, Radiation Interaction, Detectors and Medical Physics Applications. ISBN 978-981-4307-51-2.
- JazykLanguage
- eng
- ScopusScopus
- 2-s2.0-84886903421
- RIVRIV
- RIV/68407700:21670/10:00179469!RIV11-MSM-21670___
- ProjektProject
- Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation; Spolupráce ČR s CERNCollaboration of the Czech Republic with CERN
AbstraktAbstract
An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation.
An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation.