Non-contact electron optics system for coincidence imaging analysis
- NázevTitle
- Non-contact electron optics system for coincidence imaging analysisNon-contact electron optics system for coincidence imaging analysis
- Druh výsledkuResult type
- Příspěvek ve sborníkuProceedings paper
- AutořiAuthors
- M. Kroupa, J. Jakůbek, F. Krejčí
- Klíčová slovaKeywords
- electron optics, electron imaging, Instrumental Neutron Activation Analysis
- KonferenceConference
- 11th ICATPP Conference on Astroparticle, Particle, Space Physics, Detectors and Medical Physics Applications (Villa Olmo, Italy, 2009-10-05)
- DOIDOI
- 10.1142/9789814307529_0104
- Časopis / citaceJournal / citation
- In: Astroparticle, Particle and Space Physics, Detectors and Medical Physics Applications, WORLD SCIENTIFIC, 2010, pp. 631-635
- RokYear
- 2010
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation; Spolupráce ČR s CERNCollaboration of the Czech Republic with CERN
- CitovánoCited by
- 1 (OpenAlex)
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation.
An electron imaging system has been developed for spatial information in coincidence Instrumental Neutron Activation Analysis. In our technique, a beta-radioactive sample is scanned at once where the electrons are detected in the position-sensitive Timepix detector in coincidence with γ-rays. Following our previous work where the detector was used in close-contact sample geometry, we have built a devoted non-contact electron optic system to focus coincidence electrons for imaging measurements with enhanced spatial resolution and reduced blurring. This contribution describes the electron focusing system and its evaluation.