Active-edge planar silicon sensors for large-area pixel detectors
- NázevTitle
- Active-edge planar silicon sensors for large-area pixel detectorsActive-edge planar silicon sensors for large-area pixel detectors
- Druh výsledkuResult type
- Příspěvek ve sborníkuProceedings paper
- AutořiAuthors
- M. Bosma, H. Heijne, J. Kalliopuska, J. Visser, E. Koffeman
- DOIDOI
- 10.1109/NSSMIC.2011.6154336
- Časopis / citaceJournal / citation
- In: IEEE Nuclear Science Symposium and Medical Imaging Conference 2011. Piscataway, New Jersey: Omnipress, 2011, pp. 1329-1333. ISSN 1082-3654. ISBN 978-1-4673-0118-3. Available from: http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6154336
- JazykLanguage
- eng
- WoSWoS
- 000304755601110
- ScopusScopus
- 2-s2.0-84858681429
- RIVRIV
- RIV/68407700:21670/11:00204578!RIV13-MSM-21670___
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.; Fundamentální experimenty ve fyzice mikrosvětaFundamental Experiments in Physics of Microworld
AbstraktAbstract
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.