Active-edge planar silicon sensors for large-area pixel detectors
- NázevTitle
- Active-edge planar silicon sensors for large-area pixel detectorsActive-edge planar silicon sensors for large-area pixel detectors
- Druh výsledkuResult type
- Příspěvek ve sborníkuProceedings paper
- AutořiAuthors
- M. Bosma, H. Heijne, J. Kalliopuska, J. Visser, E. Koffeman
- Klíčová slovaKeywords
- position sensitive particle detectors, SENSOR, silicon devices, X-ray detector, pixel detector, 3D reconstruction
- KonferenceConference
- 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (Valencia, Spain, 2011-10-23)
- DOIDOI
- 10.1109/NSSMIC.2011.6154336
- Časopis / citaceJournal / citation
- In: 2011 IEEE Nuclear Science Symposium Conference Record, IEEE, 2011, pp. 1329-1333 · ISSN 1082-3654
- RokYear
- 2011
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.; Fundamentální experimenty ve fyzice mikrosvětaFundamental Experiments in Physics of Microworld
- CitovánoCited by
- 2 (OpenAlex)
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.