Edgeless planar semiconductor sensors for a Medipix3-based radiography detector
- NázevTitle
- Edgeless planar semiconductor sensors for a Medipix3-based radiography detectorEdgeless planar semiconductor sensors for a Medipix3-based radiography detector
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- M. Bosma, H. Heijne, J. Kalliopuska, J. Visser, E. Koffeman
- Klíčová slovaKeywords
- detector modelling, detector simulations, Hybrid detector, Particle tracking detector, X-ray radiography, Digital radiography
- KonferenceConference
- 13th International Workshop on Radiation Imaging Detectors (Villingen and Zurich, Switzerland, 2011-07-03)
- DOIDOI
- 10.1088/1748-0221/6/11/C11019
- Časopis / citaceJournal / citation
- Journal of Instrumentation 6(11), C11019-C11019 (2011) · ISSN 1748-0221
- RokYear
- 2011
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Fundamentální experimenty ve fyzice mikrosvětaFundamental Experiments in Physics of Microworld; Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
- CitovánoCited by
- 1 (INSPIRE-HEP)
- Plný text (open access)Full text (open access)
- https://iopscience.iop.org/article/10.1088/1748-0221/6/11/C11019/pdf
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.