Edgeless planar semiconductor sensors for a Medipix3-based radiography detector
- NázevTitle
- Edgeless planar semiconductor sensors for a Medipix3-based radiography detectorEdgeless planar semiconductor sensors for a Medipix3-based radiography detector
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- M. Bosma, H. Heijne, J. Kalliopuska, J. Visser, E. Koffeman
- DOIDOI
- 10.1088/1748-0221/6/11/C11019
- Časopis / citaceJournal / citation
- Journal of Instrumentation. 2011, 6(11), ISSN 1748-0221.
- RokYear
- 2011
- JazykLanguage
- eng
- WoSWoS
- 000298320400019
- ScopusScopus
- 2-s2.0-82955201748
- RIVRIV
- RIV/68407700:21670/11:00204580!RIV13-MSM-21670___
- ProjektProject
- Fundamentální experimenty ve fyzice mikrosvětaFundamental Experiments in Physics of Microworld; Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
AbstraktAbstract
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.
We study the influence of active edges on the response of edge pixels by comparing simulations of the electrostatic-potential distribution to position-defined measurements on the energy deposition. A laser setup was used to measure the edge-pixel response function and shows the sensitive edge is only about 2 μm from the physical edge. 3D reconstruction of tracks from high-energy pions and muons, produced at the SPS H6 test beam facility at CERN, enabled to relate the energy deposition at edge pixels to the particle's interaction depth. A clear correlation is observed between the simulated electric-field distortion and the reconstructed interaction-depth dependent effective size.