Energy loss and online directional track visualization of fast electrons with the pixel detector Timepix
- NázevTitle
- Energy loss and online directional track visualization of fast electrons with the pixel detector TimepixEnergy loss and online directional track visualization of fast electrons with the pixel detector Timepix
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- C. Granja, P. Krist, D. Chvatil, J. Šolc, S. Pospíšil, L. Opálka, J. Jakůbek
- Klíčová slovaKeywords
- Interaction of radiation with matter, dE/dx detectors, Particle tracking detector, Hybrid pixel detector, Active nuclear emulsion, Energy loss
- DOIDOI
- 10.1016/j.radmeas.2013.07.006
- Časopis / citaceJournal / citation
- Radiation Measurements 59, 245-261 (2013) · ISSN 1350-4487
- RokYear
- 2013
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Centrum experimentální jaderné astrofyziky a jaderné fyzikyCenter of Experimental Nuclear Astrophysics and Nuclear Physics
- CitovánoCited by
- 16 (INSPIRE-HEP)
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
The spectral-, position- and tracking-response of Timepix to energetic electrons has been tested and characterized with well-defined low-intensity parallel beams of monoenergetic electrons in the 7 e21 MeV range. The per-pixel energy sensitivity of Timepix serves as a position-sensitive dE/dx detector to determine the energy loss over along the particle track. The sampling path pitch can be set to 55 mm (pixel-size) and arbitrary values between 300 mm (sensor thickness) and nearly 2 mm. Timepix can register and visualize not only the position and trajectories but also the direction of trajectories and the rate of directional scattering of single fast electrons across the semiconductor sensor. The technique serves to measure the spatial distribution of a parallel beam, the beam size spread, transversal beam flux homogeneity and lateral straggling at the pixel-size scale. The mean scattering path along the beam axis and the mean path for lateral beam straggling in silicon can be determined. Measured energy loss distributions were compared with model and previous data as well as with dedicated Monte Carlo MCNPX simulations performed for this work. Tracking distributions were also simulated.
The spectral-, position- and tracking-response of Timepix to energetic electrons has been tested and characterized with well-defined low-intensity parallel beams of monoenergetic electrons in the 7 e21 MeV range. The per-pixel energy sensitivity of Timepix serves as a position-sensitive dE/dx detector to determine the energy loss over along the particle track. The sampling path pitch can be set to 55 mm (pixel-size) and arbitrary values between 300 mm (sensor thickness) and nearly 2 mm. Timepix can register and visualize not only the position and trajectories but also the direction of trajectories and the rate of directional scattering of single fast electrons across the semiconductor sensor. The technique serves to measure the spatial distribution of a parallel beam, the beam size spread, transversal beam flux homogeneity and lateral straggling at the pixel-size scale. The mean scattering path along the beam axis and the mean path for lateral beam straggling in silicon can be determined. Measured energy loss distributions were compared with model and previous data as well as with dedicated Monte Carlo MCNPX simulations performed for this work. Tracking distributions were also simulated.