Fabrication, characterization and simulation of channel stop for n in p-substrate silicon pixel detectors
- NázevTitle
- Fabrication, characterization and simulation of channel stop for n in p-substrate silicon pixel detectorsFabrication, characterization and simulation of channel stop for n in p-substrate silicon pixel detectors
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- G. Thungström, O. Esebamen, D. Krapohl, C. Fröjdh, H.-E. Nilsson, S. Petersson, R. Brenner
- Klíčová slovaKeywords
- Solid state detectors, radiation-hard detectors, Electronic detector readout concepts (solid-state), p-substrate, inversion layers, cross-talk
- KonferenceConference
- 15th International Workshop on Radiation Imaging Detector (Paris, France, 2013-06-23)
- DOIDOI
- 10.1088/1748-0221/9/07/C07013
- Časopis / citaceJournal / citation
- Journal of Instrumentation 9(07), C07013-C07013 (2014) · ISSN 1748-0221
- RokYear
- 2014
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.; Spolupráce ČR s CERNCollaboration of the Czech Republic with CERN
- CitovánoCited by
- 1 (INSPIRE-HEP)
- Plný text (open access)Full text (open access)
- https://iopscience.iop.org/article/10.1088/1748-0221/9/07/C07013/pdf
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
Silicon detectors made on p-substrates are expected to have a better radiation hardness as compared to detectors made on n-substrates. However, the fixed positive oxide charges induce an inversion layer of electrons in the substrate, which connects the pixels. The common means of solving this problem is by using a p-spray, individual p-stops or a combination of the two. Here, we investigate the use of field plates to suppress the fixed positive charges and to prevent the formation of an inversion layer. The fabricated detector shows a high breakdown voltage and low interpixel leakage current for a structure using biased field plates with a width of 20 μm. By using a spice model for simulation of the preamplifier, a cross talk of about 1.6% is achieved with this detector structure. The cross talk is caused by capacitive and resistive coupling between the pixels.
Silicon detectors made on p-substrates are expected to have a better radiation hardness as compared to detectors made on n-substrates. However, the fixed positive oxide charges induce an inversion layer of electrons in the substrate, which connects the pixels. The common means of solving this problem is by using a p-spray, individual p-stops or a combination of the two. Here, we investigate the use of field plates to suppress the fixed positive charges and to prevent the formation of an inversion layer. The fabricated detector shows a high breakdown voltage and low interpixel leakage current for a structure using biased field plates with a width of 20 μm. By using a spice model for simulation of the preamplifier, a cross talk of about 1.6% is achieved with this detector structure. The cross talk is caused by capacitive and resistive coupling between the pixels.