Fast Spectroscopic Imaging with Pixel Semiconductor Detector Timepix and Parallel Data Reading

AbstraktAbstract

Non-invasive techniques utilizing X-ray radiation offer a powerful tool for the inspection of the inner composition of a wide variety of objects. The highly sensitive hybrid semiconductor pixel detector, Timepix, is capable of detecting and resolving subtle and low-contrast differences in radiography measurements. The ability of detector to set the individual detection threshold for each pixel leads to practically unlimited contrast in the resulting X-ray transmission images. The spatial resolution at the level of hundreds of nanometres can be achieved with the state-of-the-art nano-focus X-ray tubes. The technical description of the new FITPix3 parallel readout together with the progression in spectroscopic imaging techniques such as the multi-channel energy imaging and X-ray fluorescence surface mapping demonstrated on cultural heritage and material sciences objects are presented in this contribution.

Non-invasive techniques utilizing X-ray radiation offer a powerful tool for the inspection of the inner composition of a wide variety of objects. The highly sensitive hybrid semiconductor pixel detector, Timepix, is capable of detecting and resolving subtle and low-contrast differences in radiography measurements. The ability of detector to set the individual detection threshold for each pixel leads to practically unlimited contrast in the resulting X-ray transmission images. The spatial resolution at the level of hundreds of nanometres can be achieved with the state-of-the-art nano-focus X-ray tubes. The technical description of the new FITPix3 parallel readout together with the progression in spectroscopic imaging techniques such as the multi-channel energy imaging and X-ray fluorescence surface mapping demonstrated on cultural heritage and material sciences objects are presented in this contribution.