High-contrast X-ray micro-tomography of low attenuation samples using large area hybrid semiconductor pixel detector array of 10x5 Timepix chips
- NázevTitle
- High-contrast X-ray micro-tomography of low attenuation samples using large area hybrid semiconductor pixel detector array of 10x5 Timepix chipsHigh-contrast X-ray micro-tomography of low attenuation samples using large area hybrid semiconductor pixel detector array of 10x5 Timepix chips
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- J. Karch, F. Krejčí, B. Bartl, J. Dudák, J. Kuba, J. Kvaček, J. Žemlička
- Klíčová slovaKeywords
- X-ray detector, Computerized Tomography (CT) and Computed Radiography (CR), X-ray radiography and digital radiography
- DOIDOI
- 10.1088/1748-0221/11/01/C01073
- Časopis / citaceJournal / citation
- Journal of Instrumentation 11(01), C01073-C01073 (2016) · ISSN 1748-0221
- RokYear
- 2016
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Nedestruktivní metody jako nástroj pro studium diversity křídových rostlinNon-destructive methods as a tool for studies on diversity of Cretaceous fossil plants
- CitovánoCited by
- 2 (OpenAlex)
- Plný text (open access)Full text (open access)
- https://iopscience.iop.org/article/10.1088/1748-0221/11/01/C01073/pdf
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
State-of-the-art hybrid pixel semiconductor detectors provide excellent imaging properties such as unlimited dynamic range, high spatial resolution, high frame rate and energy sensitivity. Nevertheless, a limitation in the use of these devices for imaging has been the small sensitive area of a few square centimetres. In the field of microtomography we make use of a large area pixel detector assembled from 50 Timepix edgeless chips providing fully sensitive area of 14.3 × 7.15 cm2. We have successfully demonstrated that the enlargement of the sensitive area enables high-quality tomographic measurements of whole objects with high geometrical magnification without any significant degradation in resulting reconstructions related to the chip tilling and edgeless sensor technology properties. The technique of micro-tomography with the newly developed large area detector is applied for samples formed by low attenuation, low contrast materials such a seed from Phacelia tanacetifolia, a charcoalified wood sample and a beeswax seal sample.
State-of-the-art hybrid pixel semiconductor detectors provide excellent imaging properties such as unlimited dynamic range, high spatial resolution, high frame rate and energy sensitivity. Nevertheless, a limitation in the use of these devices for imaging has been the small sensitive area of a few square centimetres. In the field of microtomography we make use of a large area pixel detector assembled from 50 Timepix edgeless chips providing fully sensitive area of 14.3 × 7.15 cm2. We have successfully demonstrated that the enlargement of the sensitive area enables high-quality tomographic measurements of whole objects with high geometrical magnification without any significant degradation in resulting reconstructions related to the chip tilling and edgeless sensor technology properties. The technique of micro-tomography with the newly developed large area detector is applied for samples formed by low attenuation, low contrast materials such a seed from Phacelia tanacetifolia, a charcoalified wood sample and a beeswax seal sample.