ÚTEFČVUT Ústav technické a experimentální fyziky ČVUT v PrazeInstitute of Experimental and Applied Physics, CTU in Prague

X-ray imaging with sub-micron resolution using large-area photon counting detectors Timepix

NázevTitle
X-ray imaging with sub-micron resolution using large-area photon counting detectors TimepixX-ray imaging with sub-micron resolution using large-area photon counting detectors Timepix
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
J. Dudák, J. Karch, K. Holcova, J. Žemlička
Klíčová slovaKeywords
X-ray radiography and digital radiography, Computerized Tomography (CT) and Computed Radiography (CR), Pixelated detectors and associated VLSI electronic
DOIDOI
10.1088/1748-0221/12/12/C12024
Časopis / citaceJournal / citation
Journal of Instrumentation 12(12), C12024-C12024 (2017) · ISSN 1748-0221
RokYear
2017
JazykLanguage
eng
ZáznamyRecords
ProjektProject
Pokročilé techniky rentgenové radiografie pro přírodní vědy a průmyslAdvanced techniques of X-ray radiography for life sciences and industry
CitovánoCited by
5 (OpenAlex)
2018: 12019: 12020: 22021: 02022: 02023: 02024: 1
Plný text (open access)Full text (open access)
https://iopscience.iop.org/article/10.1088/1748-0221/12/12/C12024/pdf
Citace ke staženíDownload citation
TXT · BibTeX

AbstraktAbstract

As X-ray micro-CT became a popular tool for scientific purposes a number of commercially available CT systems have emerged on the market. Micro-CT systems have, therefore, become widely accessible and the number of research laboratories using them constantly increases. However, even when CT scans with spatial resolution of several micrometers can be performed routinely, data acquisition with sub- micron precision remains a complicated task. Issues come mostly from prolongation of the scan time inevitably connected with the use of nano-focus X-ray sources. Long exposure time increases the noise level in the CT projections. Furthermore, considering the sub- micron resolution even effects like source-spot drift, rotation stage wobble or thermal expansion become significant and can negatively affect the data. The use of dark-current free photon counting detectors as X-ray cameras for such applications can limit the issue of increased image noise in the data, however the mechanical stability of the whole system still remains a problem and has to be considered. In this work we evaluate the performance of a micro-CT system equipped with nano-focus X-ray tube and a large area photon counting detector Timepix for scans with effective pixel size bellow one micrometer.

As X-ray micro-CT became a popular tool for scientific purposes a number of commercially available CT systems have emerged on the market. Micro-CT systems have, therefore, become widely accessible and the number of research laboratories using them constantly increases. However, even when CT scans with spatial resolution of several micrometers can be performed routinely, data acquisition with sub- micron precision remains a complicated task. Issues come mostly from prolongation of the scan time inevitably connected with the use of nano-focus X-ray sources. Long exposure time increases the noise level in the CT projections. Furthermore, considering the sub- micron resolution even effects like source-spot drift, rotation stage wobble or thermal expansion become significant and can negatively affect the data. The use of dark-current free photon counting detectors as X-ray cameras for such applications can limit the issue of increased image noise in the data, however the mechanical stability of the whole system still remains a problem and has to be considered. In this work we evaluate the performance of a micro-CT system equipped with nano-focus X-ray tube and a large area photon counting detector Timepix for scans with effective pixel size bellow one micrometer.

↑ NahoruTop