Multimodal analysis of cultural heritage artefacts utilizing computed tomography and x-ray fluorescence imaging
- NázevTitle
- Multimodal analysis of cultural heritage artefacts utilizing computed tomography and x-ray fluorescence imagingMultimodal analysis of cultural heritage artefacts utilizing computed tomography and x-ray fluorescence imaging
- Druh výsledkuResult type
- Příspěvek ve sborníkuProceedings paper
- AutořiAuthors
- D. Vavřík, J. Jakůbek, J. Lauterkranc, I. Kumpova, M. Vopálenský, J. Žemlička
- DOIDOI
- 10.1109/NSSMIC.2016.8069960
- Časopis / citaceJournal / citation
- In: 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop, NSS/MIC/RTSD 2016. Institute of Electrical and Electronics Engineers, Inc., 2017. ISBN 978-1-5090-1642-6.
- JazykLanguage
- eng
- ScopusScopus
- 2-s2.0-85041746379
- RIVRIV
- RIV/68407700:21670/17:00320994!RIV18-MSM-21670___
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
AbstraktAbstract
It is advantageous to combine information about geometry and inner structure of historical artefacts with information about element composition of the decorative layers, typically covering historical wooden sculptures. X-ray computed tomography describing artifact structure is quite common and easy. Standard X-ray fluorescence (XRF) analysis of decorative layers is typically done for several selected spots of the artefact surface. It will be shown in this work that effective combination of the XRF imaging and X-ray tomography fusion describing relation between chemical composition and artefact geometry can be realized even for limited number of XRF images.
It is advantageous to combine information about geometry and inner structure of historical artefacts with information about element composition of the decorative layers, typically covering historical wooden sculptures. X-ray computed tomography describing artifact structure is quite common and easy. Standard X-ray fluorescence (XRF) analysis of decorative layers is typically done for several selected spots of the artefact surface. It will be shown in this work that effective combination of the XRF imaging and X-ray tomography fusion describing relation between chemical composition and artefact geometry can be realized even for limited number of XRF images.