Ústav technické a experimentální fyziky Institute of Experimental and Applied Physics

Single layer 3D tracking semiconductor detector

NázevTitle
Single layer 3D tracking semiconductor detectorSingle layer 3D tracking semiconductor detector
Druh výsledkuResult type
PatentPatent
AutořiAuthors
M. Campbell, M. Thilo, J. Jakůbek
Časopis / citaceJournal / citation
United States of America. Patent US9297912. 2016-03-29.
RokYear
2016
JazykLanguage
eng
RIVRIV
RIV/68407700:21670/16:00321468!RIV19-MSM-21670___
ProjektProject
Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.

AbstraktAbstract

The invention relates to a pixel detector, comprising a semiconductor sensor layer, in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer connected to said semiconductor layer, said read-out electronics layer comprising an array of read-out circuits for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer. The neighboring read-out circuits are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits. The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighboring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.

The invention relates to a pixel detector, comprising a semiconductor sensor layer, in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer connected to said semiconductor layer, said read-out electronics layer comprising an array of read-out circuits for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer. The neighboring read-out circuits are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits. The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighboring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.