Single layer 3D tracking semiconductor detector
- NázevTitle
- Single layer 3D tracking semiconductor detectorSingle layer 3D tracking semiconductor detector
- Druh výsledkuResult type
- PatentPatent
- AutořiAuthors
- M. Campbell, M. Thilo, J. Jakůbek
- Časopis / citaceJournal / citation
- United States of America. Patent US9297912. 2016-03-29.
- RokYear
- 2016
- JazykLanguage
- eng
- RIVRIV
- RIV/68407700:21670/16:00321468!RIV19-MSM-21670___
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
AbstraktAbstract
The invention relates to a pixel detector, comprising a semiconductor sensor layer, in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer connected to said semiconductor layer, said read-out electronics layer comprising an array of read-out circuits for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer. The neighboring read-out circuits are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits. The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighboring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.
The invention relates to a pixel detector, comprising a semiconductor sensor layer, in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y plane and has a thickness extending in Z-direction. The detector further comprises a read-out electronics layer connected to said semiconductor layer, said read-out electronics layer comprising an array of read-out circuits for detecting signals indicative of charges generated in a corresponding volume of said semiconductor sensor layer. The neighboring read-out circuits are connected by a relative timing circuit configured to determine time difference information between signals detected at said neighboring read-out circuits. The time difference information is indicative of a difference in the Z-components of the locations of charge generations in the corresponding neighboring sensor volumes caused by a particle trajectory that is inclined with respect to the X-Y-plane.