Ústav technické a experimentální fyziky Institute of Experimental and Applied Physics

A single layer 3D tracking semiconductor detector

NázevTitle
A single layer 3D tracking semiconductor detectorA single layer 3D tracking semiconductor detector
Druh výsledkuResult type
PatentPatent
AutořiAuthors
J. Jakůbek, M. Campbell, M. Thilo
Časopis / citaceJournal / citation
Japan. Patent JP6040248. 2016-12-07.
RokYear
2016
JazykLanguage
eng
RIVRIV
RIV/68407700:21670/16:00321490!RIV19-MSM-21670___
ProjektProject
Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.

AbstraktAbstract

The present invention relates to a pixel detector, comprising a semiconductor sensor layer, in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction.

The present invention relates to a pixel detector, comprising a semiconductor sensor layer, in which charges can be generated upon interaction with particles to be detected. The semiconductor layer defines an X-Y-plane and has a thickness extending in Z-direction.