Ústav technické a experimentální fyziky Institute of Experimental and Applied Physics

Properties of GaAs:Cr-based Timepix detectors

NázevTitle
Properties of GaAs:Cr-based Timepix detectorsProperties of GaAs:Cr-based Timepix detectors
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
P. Smolyanskiy, B. Bergmann, G. Chelkov, S. Kotov, U. Kruchonak, D. Kozhevnikov, Y. Mora Sierra, I. Štekl, A. Zhemchugov
DOIDOI
10.1088/1748-0221/13/02/T02005
Časopis / citaceJournal / citation
Journal of Instrumentation. 2018, 13 ISSN 1748-0221.
RokYear
2018
JazykLanguage
eng
WoSWoS
000425278400001
ScopusScopus
2-s2.0-85043477452
RIVRIV
RIV/68407700:21670/18:00322290!RIV19-MSM-21670___
ProjektProject
Urychlovač Van de Graaff - laditelný zdroj monoenergetických neutronů a lehkých iontůVan de Graaff Accelerator - a Tunable Source of Monoenergetic Neutrons and Light Ions

AbstraktAbstract

The hybrid pixel detector technology brought to the X-ray imaging a low noise level at a high spatial resolution, thanks to the single photon counting. However, silicon as the most widespread detector material is marginally sensitive to photons with energies above 30 keV. Therefore, the high-Z alternatives to silicon such as gallium arsenide and cadmium telluride are increasingly attracting attention of the community for the development of X-ray imaging systems. The results of our investigations of the Timepix detectors bump bonded to sensors made of gallium arsenide compensated by chromium (GaAs:Cr) are presented in this work. The following properties are most important from the practical point of view: the IV characteristics, the charge transport characteristics, photon detection efficiency, operational stability, homogeneity, temperature dependence, as well as energy and spatial resolution are considered. The applicability of these detectors for spectroscopic X-ray imaging is discussed.

The hybrid pixel detector technology brought to the X-ray imaging a low noise level at a high spatial resolution, thanks to the single photon counting. However, silicon as the most widespread detector material is marginally sensitive to photons with energies above 30 keV. Therefore, the high-Z alternatives to silicon such as gallium arsenide and cadmium telluride are increasingly attracting attention of the community for the development of X-ray imaging systems. The results of our investigations of the Timepix detectors bump bonded to sensors made of gallium arsenide compensated by chromium (GaAs:Cr) are presented in this work. The following properties are most important from the practical point of view: the IV characteristics, the charge transport characteristics, photon detection efficiency, operational stability, homogeneity, temperature dependence, as well as energy and spatial resolution are considered. The applicability of these detectors for spectroscopic X-ray imaging is discussed.