ÚTEFČVUT Ústav technické a experimentální fyziky ČVUT v PrazeInstitute of Experimental and Applied Physics, CTU in Prague

Performance of bulk semi-insulating GaAs-based sensor and its comparison to Si-based sensor for Timepix radiation camera

NázevTitle
Performance of bulk semi-insulating GaAs-based sensor and its comparison to Si-based sensor for Timepix radiation cameraPerformance of bulk semi-insulating GaAs-based sensor and its comparison to Si-based sensor for Timepix radiation camera
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
D. Kubanda, B. Zat'ko, A. Sagatova, J. Žemlička, J. Dudák
Klíčová slovaKeywords
X-ray detector, Inspection with x-rays, X-ray radiography and digital radiography
DOIDOI
10.1088/1748-0221/14/01/C01023
Časopis / citaceJournal / citation
Journal of Instrumentation 14(01), C01023-C01023 (2019) · ISSN 1748-0221
RokYear
2019
JazykLanguage
eng
ZáznamyRecords
ProjektProject
Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
CitovánoCited by
2 (INSPIRE-HEP)
2021: 12022: 02023: 02024: 1
Plný text (open access)Full text (open access)
https://iopscience.iop.org/article/10.1088/1748-0221/14/01/C01023/pdf
Citace ke staženíDownload citation
TXT · BibTeX

AbstraktAbstract

Nowadays, pixelated detectors based on Timepix readout chip play important role in various fields of science and research like particle physics, advanced spectrometry and especially X-ray imaging for medical and material purposes. Present work is focused on the evaluation of the 350 mu m thick prototype (semi-insulating) SI GaAs sensor performance and its comparison to 300 mu m thick Si sensor that was chosen as a reference. Both sensors consist of 256 x 256 pixels matrix with pixel pitch of 55 mu m. We performed flat field illumination to test the pixel homogeneity and found out that the response of GaAs sensor is less homogeneous in terms of number of counts across the sensor compared to Si sensor. The imaging performance was tested using two samples of different absorption strength, specifically one less-absorbing sample and one more-absorbing sample. We found out that our fabricated SI GaAs sensor shows better imaging performance than Si sensor in case of imaging more-absorbing sample and vice versa. This is due to different prevalent detection efficiency regions. The spatial resolution was determined to be 8.73 lp/mm and 8.25 lp/mm for GaAs and Si sensor, respectively. Also, spectrometric measurements were carried out and results show that Si sensor has about 2 times higher energy resolution in comparison with SI GaAs sensor.

Nowadays, pixelated detectors based on Timepix readout chip play important role in various fields of science and research like particle physics, advanced spectrometry and especially X-ray imaging for medical and material purposes. Present work is focused on the evaluation of the 350 mu m thick prototype (semi-insulating) SI GaAs sensor performance and its comparison to 300 mu m thick Si sensor that was chosen as a reference. Both sensors consist of 256 x 256 pixels matrix with pixel pitch of 55 mu m. We performed flat field illumination to test the pixel homogeneity and found out that the response of GaAs sensor is less homogeneous in terms of number of counts across the sensor compared to Si sensor. The imaging performance was tested using two samples of different absorption strength, specifically one less-absorbing sample and one more-absorbing sample. We found out that our fabricated SI GaAs sensor shows better imaging performance than Si sensor in case of imaging more-absorbing sample and vice versa. This is due to different prevalent detection efficiency regions. The spatial resolution was determined to be 8.73 lp/mm and 8.25 lp/mm for GaAs and Si sensor, respectively. Also, spectrometric measurements were carried out and results show that Si sensor has about 2 times higher energy resolution in comparison with SI GaAs sensor.

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