Ústav technické a experimentální fyziky Institute of Experimental and Applied Physics

Registration of the transition radiation with GaAs detector: Data/MC comparison

NázevTitle
Registration of the transition radiation with GaAs detector: Data/MC comparisonRegistration of the transition radiation with GaAs detector: Data/MC comparison
Druh výsledkuResult type
Příspěvek ve sborníkuProceedings paper
AutořiAuthors
J. Alozy, N. Belyaev, B. Bergmann, T. Billoud, P. Burian, H. Heijne, L. Meduna, S. Pospíšil, P. Smolyanskiy
DOIDOI
10.1088/1742-6596/1690/1/012041
Časopis / citaceJournal / citation
In: Journal of Physics: Conference Series. Bristol: IOP Publishing Ltd, 2020. vol. 1690. ISSN 1742-6588.
JazykLanguage
eng
ScopusScopus
2-s2.0-85098330751
RIVRIV
RIV/68407700:21670/20:00346718!RIV21-MSM-21670___
ProjektProject
Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.

AbstraktAbstract

Abstract. New developments of pixel detectors based on GaAs sensors offer effective registration of the transition radiation (TR) X-rays and perform simultaneous measurements of their energies and emission angles. This unique feature opens new possibilities for particle identification on the basis of maximum available information about generated TR photons. Results of studies of TR energy-angular distributions using a 500 μm thick GaAs sensor attached to a Timepix3 chip are presented. Measurements, analysis techniques and a comparison with Monte Carlo (MC) simulations are described and discussed.

Abstract. New developments of pixel detectors based on GaAs sensors offer effective registration of the transition radiation (TR) X-rays and perform simultaneous measurements of their energies and emission angles. This unique feature opens new possibilities for particle identification on the basis of maximum available information about generated TR photons. Results of studies of TR energy-angular distributions using a 500 μm thick GaAs sensor attached to a Timepix3 chip are presented. Measurements, analysis techniques and a comparison with Monte Carlo (MC) simulations are described and discussed.