ÚTEFČVUT Ústav technické a experimentální fyziky ČVUT v PrazeInstitute of Experimental and Applied Physics, CTU in Prague

Studies of the spectral and angular distributions of transition radiation using a silicon pixel sensor on a Timepix3 chip

NázevTitle
Studies of the spectral and angular distributions of transition radiation using a silicon pixel sensor on a Timepix3 chipStudies of the spectral and angular distributions of transition radiation using a silicon pixel sensor on a Timepix3 chip
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
J. Alozy, N. Belyaev, M. Campbell, E.H.M. Heijne
Klíčová slovaKeywords
Timepix3, pixel detector, particle identification, transition radiation, X-ray transition radiation detectors, detector resolution
DOIDOI
10.1016/j.nima.2020.163681
Časopis / citaceJournal / citation
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 961, 163681 (2020) · ISSN 0168-9002
RokYear
2020
JazykLanguage
eng
ZáznamyRecords
ProjektProject
Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
CitovánoCited by
12 (INSPIRE-HEP)
2020: 32021: 02022: 22023: 32024: 22025: 12026: 1
Plný text (open access)Full text (open access)
http://dspace.bsu.edu.ru/bitstream/123456789/42187/1/Savchenko_Studies.pdf
Citace ke staženíDownload citation
TXT · BibTeX

AbstraktAbstract

X-ray transition radiation detectors (TRDs) are used for particle identification in both high energy physics and astroparticle physics. In most of the detectors, emission of the X-ray transition radiation (TR) starts at Lorentz factors above and reaches saturation at . However, many experiments require particle identification up to , which is very difficult to achieve with conventional detectors. Semiconductor pixel detectors offer a unique opportunity for precise simultaneous measurements of spectral and angular parameters of TR photons. Test beam studies of the energy and the angular distributions of TR photons emitted by electrons and muons of different momenta crossing several types of radiators were performed at the CERN SPS with a 480 m thick silicon detector bonded to a Timepix3 chip. High resolution images of the phase space of the TR produced by different radiators were obtained and compared with MC simulations. The characteristic interference patterns are in agreement with the theoretical models with an unprecedented level of details. The studies presented in this paper also show that simultaneous measurements of both the energy and the emission angles of the TR X-rays could be used to enhance the particle identification performances of TRDs.

X-ray transition radiation detectors (TRDs) are used for particle identification in both high energy physics and astroparticle physics. In most of the detectors, emission of the X-ray transition radiation (TR) starts at Lorentz factors above and reaches saturation at . However, many experiments require particle identification up to , which is very difficult to achieve with conventional detectors. Semiconductor pixel detectors offer a unique opportunity for precise simultaneous measurements of spectral and angular parameters of TR photons. Test beam studies of the energy and the angular distributions of TR photons emitted by electrons and muons of different momenta crossing several types of radiators were performed at the CERN SPS with a 480 m thick silicon detector bonded to a Timepix3 chip. High resolution images of the phase space of the TR produced by different radiators were obtained and compared with MC simulations. The characteristic interference patterns are in agreement with the theoretical models with an unprecedented level of details. The studies presented in this paper also show that simultaneous measurements of both the energy and the emission angles of the TR X-rays could be used to enhance the particle identification performances of TRDs.

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