Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors
- NázevTitle
- Understanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectorsUnderstanding ionizing energy losses after charged particle and neutron impact in semiconductors with hybrid pixel detectors
- Druh výsledkuResult type
- Zvaná přednáškaInvited lecture
- AutořiAuthors
- B. Bergmann
- Časopis / citaceJournal / citation
- [Invited unpublished scientific lecture] Pilsen: 28th International Conference on Applied Electronics (APPEL) 2022, University of West Bohemia. 2022-09-06.
- RokYear
- 2022
- JazykLanguage
- eng
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons.
Hybrid pixel detectors of Timepix3 technology allow noiseless single particle detection and identification. We exploit this capability for a comprehensive study of ionizing energy losses and their spatial distribution in silicon sensors after exposure to charged particles and neutrons.