EFFECTS OF HELIUM ION IRRADIATION ON TUNGSTEN-BASED COMPOSITES: NEUTRON DIFFRACTION; AS A REAL-TIME DIFFRACTOMETER
- NázevTitle
- EFFECTS OF HELIUM ION IRRADIATION ON TUNGSTEN-BASED COMPOSITES: NEUTRON DIFFRACTION; AS A REAL-TIME DIFFRACTOMETEREFFECTS OF HELIUM ION IRRADIATION ON TUNGSTEN-BASED COMPOSITES: NEUTRON DIFFRACTION; AS A REAL-TIME DIFFRACTOMETER
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- D. Neov, A.I. Beskrovnyi, A.S. Abiyev, D.M. Mirzayeva, F. Mamedov
- Časopis / citaceJournal / citation
- Advanced Physical Research. 2023, 5(2), 95-102. ISSN 2663-8436.
- RokYear
- 2023
- JazykLanguage
- eng
- ScopusScopus
- 2-s2.0-85163717368
- RIVRIV
- RIV/68407700:21670/23:00373274!RIV24-MSM-21670___
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
AbstraktAbstract
The weight ratio 6% was formed for this paper by B4C-2% (99.5% purity, 20 µm particle size), TiC-1% (99.5% purity, 15 µm particle size), C (99.5% purity, 21 µm particle size) and the remaining part is tungsten W (99.5% purity, 17 µm particle size) structure had been established. In order to get homogeneous sinter, it was subjected to a temperature gradient of up to 1750 °C for 2 hours with a temperature step of 5 °C per minute. In the study, neutron diffraction (ND) was performed using the timeof-flight technique (TOF) in the IBR-2M research reactor. The obtained data were refined with the FULLPROF Rietveld suite. The results convey that it is different from the results obtained by X-Ray diffraction.
The weight ratio 6% was formed for this paper by B4C-2% (99.5% purity, 20 µm particle size), TiC-1% (99.5% purity, 15 µm particle size), C (99.5% purity, 21 µm particle size) and the remaining part is tungsten W (99.5% purity, 17 µm particle size) structure had been established. In order to get homogeneous sinter, it was subjected to a temperature gradient of up to 1750 °C for 2 hours with a temperature step of 5 °C per minute. In the study, neutron diffraction (ND) was performed using the timeof-flight technique (TOF) in the IBR-2M research reactor. The obtained data were refined with the FULLPROF Rietveld suite. The results convey that it is different from the results obtained by X-Ray diffraction.