ÚTEFČVUT Ústav technické a experimentální fyziky ČVUT v PrazeInstitute of Experimental and Applied Physics, CTU in Prague

Investigation of the gamma radiation resistance of MAPD-3NK and MPPC-S12572-10P SiPMs

NázevTitle
Investigation of the gamma radiation resistance of MAPD-3NK and MPPC-S12572-10P SiPMsInvestigation of the gamma radiation resistance of MAPD-3NK and MPPC-S12572-10P SiPMs
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
F. Ahmadov, A. Mammadli, A. Sadygov, D. Berikov, M. Holík, F. Mamedov
Klíčová slovaKeywords
Gamma source, Micropixel avalanche photodiode, Plastic scintillator, SiPM
DOIDOI
10.1016/j.radmeas.2025.107422
Časopis / citaceJournal / citation
Radiation Measurements 183, 107422 (2025) · ISSN 1350-4487
RokYear
2025
JazykLanguage
eng
ZáznamyRecords
ProjektProject
Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
CitovánoCited by
5 (OpenAlex)
2025: 32026: 2
Citace ke staženíDownload citation
TXT · BibTeX

AbstraktAbstract

In this paper, we investigate the physical properties of the MPPC-S12572-10P and MAPD-3NK silicon photomultipliers (SiPMs) operating in Geiger mode with both deep-buried pixels and surface pixel structure under the influence of gamma radiation with an average energy of 1.25 MeV. Both types of photodiodes were irradiated with doses of 10 kGy, 40 kGy and 100 kGy. Changes in the dark current, capacitance, photosignal amplitude and operating voltage of the irradiated photodiodes were studied.

In this paper, we investigate the physical properties of the MPPC-S12572-10P and MAPD-3NK silicon photomultipliers (SiPMs) operating in Geiger mode with both deep-buried pixels and surface pixel structure under the influence of gamma radiation with an average energy of 1.25 MeV. Both types of photodiodes were irradiated with doses of 10 kGy, 40 kGy and 100 kGy. Changes in the dark current, capacitance, photosignal amplitude and operating voltage of the irradiated photodiodes were studied.

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