Characterisation of the Timepix4 silicon sensor detector for low energy X-ray applications
- NázevTitle
- Characterisation of the Timepix4 silicon sensor detector for low energy X-ray applicationsCharacterisation of the Timepix4 silicon sensor detector for low energy X-ray applications
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- T. Genetay, J. Alozy, M. Campbell, L. Desorgher, L. Tlustos
- DOIDOI
- 10.1016/j.nima.2025.171163
- Časopis / citaceJournal / citation
- Nuclear Instruments and Methods in Physics Research, Section A, Accelerators, Spectrometers, Detectors and Associated Equipment. 2026, 1083 1-8. ISSN 0168-9002.
- RokYear
- 2026
- JazykLanguage
- eng
- WoSWoS
- 001618493300001
- ScopusScopus
- 2-s2.0-105021476399
- RIVRIV
- ProjektProject
- Institucionální podpora na rozvoj výzkumné org.Institucionální podpora na rozvoj výzkumné org.
AbstraktAbstract
This study aims to provide a characterisation of the Timepix4 hybrid pixel detector (HPD) in terms of energy calibration, energy resolution, temperature response and angular response for low-energy photon applications (20-150 key). The Timepix4 detector used in this study was bump-bonded to a 300 mu m thick silicon sensor. The characterisation was performed using X-ray fluorescence lines from several materials and 3 radioactive sources: 55Fe, 109Cd and 241Am. In this context, the Timepix4 HPD shows excellent performances, with an energy resolution ranging from 43.52% at 5.89 key to 7.84% at 59.54 key. The measured energy resolution was slightly better than with previous versions of the detector. A strong angular dependence was observed, with a photon count ratio decreasing by up to a factor of 2 for 55Fe and 85% for 241Am with a 90 degrees rotation. The detector should therefore be used with restricted angular ranges to limit incorrect photonic fluences. Temperature was observed over the tested range to have a minimal impact. The relative energy shift for the 241Am 59.54 key peak varied between 0.74% from 10 degrees C to 1% at 40 degrees C, showing a linear relationship between the temperature variation and the position of the photopeak. No correlation between the temperature variation and the number of counts in the photopeak was observed, but a small energy resolution loss with the increasing temperature was identified. The use of correction factors or the implementation of the associated uncertainty should be considered in the case of large temperature variations in between measurements.
This study aims to provide a characterisation of the Timepix4 hybrid pixel detector (HPD) in terms of energy calibration, energy resolution, temperature response and angular response for low-energy photon applications (20-150 key). The Timepix4 detector used in this study was bump-bonded to a 300 mu m thick silicon sensor. The characterisation was performed using X-ray fluorescence lines from several materials and 3 radioactive sources: 55Fe, 109Cd and 241Am. In this context, the Timepix4 HPD shows excellent performances, with an energy resolution ranging from 43.52% at 5.89 key to 7.84% at 59.54 key. The measured energy resolution was slightly better than with previous versions of the detector. A strong angular dependence was observed, with a photon count ratio decreasing by up to a factor of 2 for 55Fe and 85% for 241Am with a 90 degrees rotation. The detector should therefore be used with restricted angular ranges to limit incorrect photonic fluences. Temperature was observed over the tested range to have a minimal impact. The relative energy shift for the 241Am 59.54 key peak varied between 0.74% from 10 degrees C to 1% at 40 degrees C, showing a linear relationship between the temperature variation and the position of the photopeak. No correlation between the temperature variation and the number of counts in the photopeak was observed, but a small energy resolution loss with the increasing temperature was identified. The use of correction factors or the implementation of the associated uncertainty should be considered in the case of large temperature variations in between measurements.