Energy- and position-sensitive pixel detector Timepix for X-ray fluorescence imaging
- NázevTitle
- Energy- and position-sensitive pixel detector Timepix for X-ray fluorescence imagingEnergy- and position-sensitive pixel detector Timepix for X-ray fluorescence imaging
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- J. Žemlička, J. Jakůbek, M. Kroupa, V. Tichý
- DOIDOI
- 10.1016/j.nima.2009.03.140
- Časopis / citaceJournal / citation
- Nuclear Instruments and Methods in Physics Research, Section A, Accelerators, Spectrometers, Detectors and Associated Equipment. 2009, 2009(607), 202-204. ISSN 0168-9002.
- RokYear
- 2009
- JazykLanguage
- eng
- WoSWoS
- 000268987900058
- ScopusScopus
- 2-s2.0-67649203395
- RIVRIV
- RIV/68407700:21230/09:00165122!RIV10-MSM-21230___
- ProjektProject
- Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation; Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation
AbstraktAbstract
The Timepix device presents significant potential for X-Ray induced fluorescence (XRF) imaging. However limited energy resolution of this device restrains direct element identification via their radiation patter. Based on theoretical Monte Carlo simulations and measured data a per pixel spectra decomposition method has been proposed. This method consists of two phases - a first phase which determines the response of each pixel to characteristic radiation of individual elements and a second phase with the decomposition of unknown complex spectra to a set of individual elemental spectra. With precise calibration this technique allows us to distinguish area distribution of elements. We are able to recognize elements heavier than potassium (K) i.e. calcium (Ca), scandium (Sc), titanium (Ti) etc. These elements may even have their characteristic radiation lines located in a narrow energetic range like nickel (Ni), copper (Cu) and zinc (Zn).
The Timepix device presents significant potential for X-Ray induced fluorescence (XRF) imaging. However limited energy resolution of this device restrains direct element identification via their radiation patter. Based on theoretical Monte Carlo simulations and measured data a per pixel spectra decomposition method has been proposed. This method consists of two phases - a first phase which determines the response of each pixel to characteristic radiation of individual elements and a second phase with the decomposition of unknown complex spectra to a set of individual elemental spectra. With precise calibration this technique allows us to distinguish area distribution of elements. We are able to recognize elements heavier than potassium (K) i.e. calcium (Ca), scandium (Sc), titanium (Ti) etc. These elements may even have their characteristic radiation lines located in a narrow energetic range like nickel (Ni), copper (Cu) and zinc (Zn).