X-ray polarimetry by means of Compton scattering in the sensor of a hybrid photon counting pixel detector
- NázevTitle
- X-ray polarimetry by means of Compton scattering in the sensor of a hybrid photon counting pixel detectorX-ray polarimetry by means of Compton scattering in the sensor of a hybrid photon counting pixel detector
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- T. Michel, J. Durst, J. Jakůbek
- Klíčová slovaKeywords
- X-ray, Polarization, Polarimetry, Photon counting pixel detector
- DOIDOI
- 10.1016/j.nima.2009.02.032
- Časopis / citaceJournal / citation
- Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 603(3), 384-392 (2009) · ISSN 0168-9002
- RokYear
- 2009
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation; Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation
- CitovánoCited by
- 14 (OpenAlex)
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
For the first time a hybrid semiconductor photon counting pixel detector has been used for measurements of linear X-ray polarization by exploiting the Compton effect in the silicon sensor layer. The time-to-shutter mode of the X-ray imaging detector Timepix was used to identify Compton-scattering events in the sensor layer by the analysis of coincidences. For irradiation with polarized X-ray photons of energies between 27 and 84 keV we were able to measure a large modulation factor of mu(meas) = (68.1 +/- 16.4)% for this type of X-ray polarimeter. Degree and orientation of linear polarization can be determined. This publication describes the experimental setup, data analysis method, measurement and simulation results, and gives first estimations on the polarimetric performance for an application in X-ray astronomy.
For the first time a hybrid semiconductor photon counting pixel detector has been used for measurements of linear X-ray polarization by exploiting the Compton effect in the silicon sensor layer. The time-to-shutter mode of the X-ray imaging detector Timepix was used to identify Compton-scattering events in the sensor layer by the analysis of coincidences. For irradiation with polarized X-ray photons of energies between 27 and 84 keV we were able to measure a large modulation factor of mu(meas) = (68.1 +/- 16.4)% for this type of X-ray polarimeter. Degree and orientation of linear polarization can be determined. This publication describes the experimental setup, data analysis method, measurement and simulation results, and gives first estimations on the polarimetric performance for an application in X-ray astronomy.