Back-side pulse and cluster processing for particle traces measured by pixel detector
- NázevTitle
- Back-side pulse and cluster processing for particle traces measured by pixel detectorBack-side pulse and cluster processing for particle traces measured by pixel detector
- Druh výsledkuResult type
- SoftwareSoftware
- AutořiAuthors
- J. Jakůbek
- Klíčová slovaKeywords
- pixel detector, particle tracking, cluster analysis
- Časopis / citaceJournal / citation
- [Software (for RIV)] 2009.
- RokYear
- 2009
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation; Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
Semiconductor pixel detector of ionizing radiation can detect traces of individual ionizing particles. These traces are seen as clusters of pixels with signal. The cluster shape is effected by charge sharing effect in detector and by particle properties. By proper analysis of cluster shape it is possible to determine the type, energy and in some cases even impact angle of the particle. The software can perform complex analysis and evaluation of measured traces.
Semiconductor pixel detector of ionizing radiation can detect traces of individual ionizing particles. These traces are seen as clusters of pixels with signal. The cluster shape is effected by charge sharing effect in detector and by particle properties. By proper analysis of cluster shape it is possible to determine the type, energy and in some cases even impact angle of the particle. The software can perform complex analysis and evaluation of measured traces.