Ústav technické a experimentální fyziky Institute of Experimental and Applied Physics

Hard x-ray phase contrast imaging using single absorption grating and hybrid semiconductor pixel detector

NázevTitle
Hard x-ray phase contrast imaging using single absorption grating and hybrid semiconductor pixel detectorHard x-ray phase contrast imaging using single absorption grating and hybrid semiconductor pixel detector
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
F. Krejčí, J. Jakůbek, M. Kroupa
DOIDOI
10.1063/1.3499372
Časopis / citaceJournal / citation
Review of Scientific Instruments. 2010, 81(11), 113702-113707. ISSN 0034-6748.
RokYear
2010
JazykLanguage
eng
WoSWoS
000285006500020
ScopusScopus
2-s2.0-78650280013
RIVRIV
RIV/68407700:21670/10:00172893!RIV11-MSM-21670___
ProjektProject
Spolupráce ČR s CERNCollaboration of the Czech Republic with CERN; Vyhodnocování energie odpovědné za růst trhlinyEvaluation of the energy responsible for fracture advancing; Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation; Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation

AbstraktAbstract

A method for x-ray phase contrast imaging is introduced in which only one absorption grating and a microfocus x-ray source in a tabletop setup are used. The method is based on precise subpixel position determination of the x-ray pattern projected by the grating directly from the pattern image. For retrieval of the phase gradient and absorption image (both images obtained from one exposure), it is necessary to measure only one projection of the investigated object. Thus, our method is greatly simplified compared with the phase-stepping method and our method can significantly reduce the time-consuming scanning and possibly the dose. Furthermore, the technique works with a polychromatic spectrum and gives ample variability in object magnification. Consequently, the approach can open the way to widespread application of phase contrast imaging, e.g., into clinical practice. The experimental results on a simple testing object as well as on complex biological samples are presented.

A method for x-ray phase contrast imaging is introduced in which only one absorption grating and a microfocus x-ray source in a tabletop setup are used. The method is based on precise subpixel position determination of the x-ray pattern projected by the grating directly from the pattern image. For retrieval of the phase gradient and absorption image (both images obtained from one exposure), it is necessary to measure only one projection of the investigated object. Thus, our method is greatly simplified compared with the phase-stepping method and our method can significantly reduce the time-consuming scanning and possibly the dose. Furthermore, the technique works with a polychromatic spectrum and gives ample variability in object magnification. Consequently, the approach can open the way to widespread application of phase contrast imaging, e.g., into clinical practice. The experimental results on a simple testing object as well as on complex biological samples are presented.