X-ray beam hardening based material recognition in micro-imaging
- NázevTitle
- X-ray beam hardening based material recognition in micro-imagingX-ray beam hardening based material recognition in micro-imaging
- Druh výsledkuResult type
- Článek v časopiseJournal article
- AutořiAuthors
- J. Uher, J. Jakůbek, S. Mayo, A. Stevenson, J. Tickner
- DOIDOI
- 10.1088/1748-0221/6/08/P08015
- Časopis / citaceJournal / citation
- Journal of Instrumentation. 2011, 6 ISSN 1748-0221.
- RokYear
- 2011
- JazykLanguage
- eng
- WoSWoS
- 000294493700015
- RIVRIV
- RIV/68407700:21670/11:00188293!RIV12-MSM-21670___
- ProjektProject
- Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation; Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation
AbstraktAbstract
We are developing a technique of X-ray imaging capable of identifying materials in the image. The presented technique is based on analysis of two or more images taken using different energy discrimination thresholds with a single photon counting imaging detector, Medipix2. The Medipix type detectors are devices suitable for material resolving imaging thanks to their energy sensitivity for individual photons, allowing transmission to be measured as a function of X-ray energy. The material recognition technique presented here uses the signal-to-thickness calibration method and can be applied to images collected with an X-ray tube without the use of filters.
We are developing a technique of X-ray imaging capable of identifying materials in the image. The presented technique is based on analysis of two or more images taken using different energy discrimination thresholds with a single photon counting imaging detector, Medipix2. The Medipix type detectors are devices suitable for material resolving imaging thanks to their energy sensitivity for individual photons, allowing transmission to be measured as a function of X-ray energy. The material recognition technique presented here uses the signal-to-thickness calibration method and can be applied to images collected with an X-ray tube without the use of filters.