ÚTEFČVUT Ústav technické a experimentální fyziky ČVUT v PrazeInstitute of Experimental and Applied Physics, CTU in Prague

Advanced X-ray radiography and tomography in several engineering applications

NázevTitle
Advanced X-ray radiography and tomography in several engineering applicationsAdvanced X-ray radiography and tomography in several engineering applications
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
D. Vavřík, J. Dammer, J. Jakůbek, I. Jeon, O. Jiroušek, M. Kroupa, P. Zlámal
Klíčová slovaKeywords
Beam hardening correction, Flat fiel correction, Digital radiography
DOIDOI
10.1016/j.nima.2010.06.152
Časopis / citaceJournal / citation
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 633, S152-S155 (2011) · ISSN 0168-9002
RokYear
2011
JazykLanguage
eng
ZáznamyRecords
ProjektProject
Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation; Spolupráce ČR s CERNCollaboration of the Czech Republic with CERN; Vyhodnocování energie odpovědné za růst trhlinyEvaluation of the energy responsible for fracture advancing
CitovánoCited by
18 (OpenAlex)
2011: 12012: 12013: 52014: 02015: 22016: 22017: 02018: 02019: 12020: 12021: 02022: 32023: 02024: 02025: 2
Citace ke staženíDownload citation
TXT · BibTeX

AbstraktAbstract

New developments in the fields of X-ray detectors, X-ray micro/nano sources and data processing bring new possibilities for engineering practice in many applications. Nowadays it is possible to observe an object, which was difficult to image before due to limitations such as low contrast, low dynamic range, low attenuation and/or small structural dimensions. A number of compelling problems in different applications are summarized. Digital radiograms in this work are acquired using micro- and nano-focus X-ray tubes together with semiconductor digital pixelated detectors. A beam hardening correction was done for relevant radiograms and an iterative OSEM (ordered subsets) method was applied for CT reconstructions.

New developments in the fields of X-ray detectors, X-ray micro/nano sources and data processing bring new possibilities for engineering practice in many applications. Nowadays it is possible to observe an object, which was difficult to image before due to limitations such as low contrast, low dynamic range, low attenuation and/or small structural dimensions. A number of compelling problems in different applications are summarized. Digital radiograms in this work are acquired using micro- and nano-focus X-ray tubes together with semiconductor digital pixelated detectors. A beam hardening correction was done for relevant radiograms and an iterative OSEM (ordered subsets) method was applied for CT reconstructions.

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