Characterization of Charge Collection in Various Semiconductor Sensors with Energetic Protons and Timepix Device
- NázevTitle
- Characterization of Charge Collection in Various Semiconductor Sensors with Energetic Protons and Timepix DeviceCharacterization of Charge Collection in Various Semiconductor Sensors with Energetic Protons and Timepix Device
- Druh výsledkuResult type
- Příspěvek ve sborníkuProceedings paper
- AutořiAuthors
- M. Platkevič, P. Čermák, J. Jakůbek, S. Pospíšil, I. Štekl, Z. Vykydal, J. Žemlička, C. Leroy, P. Allard, G. Bergeron, P. Soueid, C. Teyssier, R. Yapoudjian, M. Fiederle, A. Fauler, G.A. Chelkov, O. Tolbanov, A. Tyazhev, J. Vissers
- Klíčová slovaKeywords
- Tracking detector, Energetic protons, pixel detector
- KonferenceConference
- 2011 IEEE Nuclear Science Symposium and Medical Imaging Conference (Valencia, Spain, 2011-10-23)
- DOIDOI
- 10.1109/NSSMIC.2011.6154765
- Časopis / citaceJournal / citation
- In: 2011 IEEE Nuclear Science Symposium Conference Record, IEEE, 2011, pp. 4715-4719 · ISSN 1082-3654
- RokYear
- 2011
- JazykLanguage
- eng
- ZáznamyRecords
- ProjektProject
- Příprava, modifikace a charakterizace materiálů energetickým zářenímPreparation, Modification and Characterization of Materials by Energetic Radiation; Pracoviště pro nedestruktivní testování, diagnostiku a 3D zobrazování pomocí neutronové radiografie a tomografie (2011-2015, TA0/TA)Facility for nondestructive testing, diagnostics and 3D imaging based on neutron radiography and tomography.; Využití radionuklidů a ionizujícího zářeníApplication of radionuclides and ionising radiation
- CitovánoCited by
- 6 (OpenAlex)
- Citace ke staženíDownload citation
- TXT · BibTeX
AbstraktAbstract
In this work we use the Timepix chip as a multichannel tester for evaluation of properties of different semiconductor sensors. Different sensors bump-bonded to a Timepix readout chip and exposed to energetic protons with different incident angles and energies have been investigated. Data from each recorded proton track were processed individually. The extent of the charge sharing effect was evaluated along the proton track at different sensor depths. The level of charge sharing is affected by the time of charge collection which is related to the local intensity of the electric field in the sensor. This method can provide a 3D map of the electric field in the whole sensor volume.
In this work we use the Timepix chip as a multichannel tester for evaluation of properties of different semiconductor sensors. Different sensors bump-bonded to a Timepix readout chip and exposed to energetic protons with different incident angles and energies have been investigated. Data from each recorded proton track were processed individually. The extent of the charge sharing effect was evaluated along the proton track at different sensor depths. The level of charge sharing is affected by the time of charge collection which is related to the local intensity of the electric field in the sensor. This method can provide a 3D map of the electric field in the whole sensor volume.