ÚTEFČVUT Ústav technické a experimentální fyziky ČVUT v PrazeInstitute of Experimental and Applied Physics, CTU in Prague

Dependence on temperature and pixel threshold of the calibration for the Timepix detector and its correction method

NázevTitle
Dependence on temperature and pixel threshold of the calibration for the Timepix detector and its correction methodDependence on temperature and pixel threshold of the calibration for the Timepix detector and its correction method
Druh výsledkuResult type
Článek v časopiseJournal article
AutořiAuthors
D. Tureček, J. Jakůbek
Klíčová slovaKeywords
pixel detector, Radiation Imaging, Medipix, Timepix
KonferenceConference
14th International Workshop on Radiation Imaging Detectors (Figueira da Foz, Portugal, 2012-07-01)
DOIDOI
10.1088/1748-0221/8/01/C01010
Časopis / citaceJournal / citation
Journal of Instrumentation 8(01), C01010-C01010 (2013) · ISSN 1748-0221
RokYear
2013
JazykLanguage
eng
ZáznamyRecords
ProjektProject
Pokročilé techniky detekce ionizujícího zářeníAdvanced Techniques for Detection of Ionizing Radiation
CitovánoCited by
5 (INSPIRE-HEP)
2015: 12016: 02017: 02018: 02019: 02020: 12021: 12022: 02023: 12024: 02025: 1
Plný text (open access)Full text (open access)
https://iopscience.iop.org/article/10.1088/1748-0221/8/01/C01010/pdf
Citace ke staženíDownload citation
TXT · BibTeX

AbstraktAbstract

The semiconductor pixel detector Timepix (matrix of 256 256 pixels with 55 mm pitch) can be used for measurements of energies of radiation quanta. For this purpose knowledge of the energy calibration of each pixel is required. Such a calibration is nonlinear. Two calibration methods already exist that use either monochromatic radiation sources or the internal test pulse capability. In the work we compare the calibrated response of the detector with the source method and for different temperatures and detector settings. Furthermore in this work we also explore the possibility of calibrating the detector under new conditions (temperature, detector settings) by adjusting an already existing calibration for different conditions. The new cross-temperature and cross-threshold calibration is calculated based on 3 original calibrations. This approach is advantageous, because it allows improving the detector response for different conditions without the need to make a whole new calibration. It is also the only appropriate method for particular applications where the detector is for instance placed in environments beyond direct physical access such as in a nuclear reactor vessel, the LHC ATLAS detector or in outer space. The method was applied and tested on a Timepix chip equipped with a 300 mm thick Si sensor.

The semiconductor pixel detector Timepix (matrix of 256 256 pixels with 55 mm pitch) can be used for measurements of energies of radiation quanta. For this purpose knowledge of the energy calibration of each pixel is required. Such a calibration is nonlinear. Two calibration methods already exist that use either monochromatic radiation sources or the internal test pulse capability. In the work we compare the calibrated response of the detector with the source method and for different temperatures and detector settings. Furthermore in this work we also explore the possibility of calibrating the detector under new conditions (temperature, detector settings) by adjusting an already existing calibration for different conditions. The new cross-temperature and cross-threshold calibration is calculated based on 3 original calibrations. This approach is advantageous, because it allows improving the detector response for different conditions without the need to make a whole new calibration. It is also the only appropriate method for particular applications where the detector is for instance placed in environments beyond direct physical access such as in a nuclear reactor vessel, the LHC ATLAS detector or in outer space. The method was applied and tested on a Timepix chip equipped with a 300 mm thick Si sensor.

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